摘要
本文设计了一种基于Flash的大容量存储测试系统,控制电路采用单片机和CPLD相结合,可以实现高速数据采集、存储。两片闪存交替使用,不仅提高了系统的采样频率,还扩大了存储容量。
The paper introduces a method about stored testing and measurement based on Flash memory. To realize high speed collection and storage, the AVR MCU is combined with CPLD (complex programmable logical device) to control the circuit scheduling, data read and program operation of the FLASH memory. Two pieces of Flash by turns not only improve sample frequency, but also extend storage.
出处
《微计算机信息》
北大核心
2008年第8期222-223,共2页
Control & Automation
基金
多参数反滤波技术研究(981022
山西省自然基金)
