摘要
Zr-4合金在高压釜中经360℃高温水腐蚀后,用扫描探针显微镜(SPM)研究了氧化膜中的显微组织和晶粒形貌。由于SPM具有很高的水平和垂直分辨率,适合于观察表面只有微小起伏的显微组织,所以能够清晰地观察到氧化膜中的裂纹、空洞和晶粒等显微组织。测试样品的制备方法简便。
The microstructure of oxide films formed on zircaloy-4 tested in autoclave at 360 ℃ ,18. 6 MPa is investigated by means of scanning probe microscopy (SPM). The microstructure with only slight undulation on the surface can be examined by SPM,because it has very high resolution both on horizontal and vertical directions. So that the microstructure of cracks, pores and grains in oxide films can be clearly observed. The method for the preparation of SPM specimens is simple and convenient.
出处
《原子能科学技术》
EI
CAS
CSCD
2003年第z1期153-156,共4页
Atomic Energy Science and Technology
基金
国家自然科学基金(50171039)
关键词
扫描探针显微镜
锆合金
氧化膜
显微组织
scanning probe microscopy
zirconium alloy
oxide film
microstructure
