摘要
A novel method for precise measurement of complex reflection coeffcient using a four-port reflectometer is presented. First, three new complex system constants are introduced,which depend only on the scattering parameters of the four-port reflectometer. Therefore, the stability of the reflectometer is greatly improved. Then, these complex system constants are used to determine the complex reflection coeffcient F of the device under test by calibrating the reflectometer. Finally, a four-port reflectometer comprising a magic tee and a power detector is constructed and excellent experimental results are obtained.
A novel method for precise measurement of complex reflection coefficient using a four-port reflectometer is presented. First, three new complex system constants are introduced, which depend only on the scattering parameters of the four-port reflectometer. Therefore, the stability of the reflectometer is greatly improved. Then, these complex system constants are used to determine the complex reflection coefficient T of the device under test by calibrating the reflectometer. Finally, a four-port reflectometer comprising a magic tee and a power detector is constructed and excellent experimental results are obtained.
