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亚波长单缝衍射的严格求解

Method to rigorously solute sub-wavelength slit diffraction
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摘要 基于严格电磁场理论,该文提出了一种半解析方法用来严格求解亚波长单缝的衍射,同时也给出了亚波长双缝衍射场的相关表达式。数值模拟计算结果表明,单缝衍射场中光强最大值均位于缝隙结构体内;随着透射深度增加,极大光强值的个数增加,衍射场空间分布改变等。该文方法可用来研究分析亚波长区域内光束的衍射传输等问题。 A semi-analytical method based on rigorous electromagnetic field theory to rigorously solute the slit diffraction is presented here,and some expressions of the diffraction field in the double-slit are also given.Numerical calculation results show that the optical maximum intensities in the field of the slit diffraction are located at the slit structure,and the spatial distribution of the diffraction field varies and the number of these optical maximum intensities increases with the increase of the transmission depth.This method presented here can be applied to analyze the propagation of the beam diffracted by some micro-nano optical components.
作者 燕丽 李建龙
出处 《南京理工大学学报》 EI CAS CSCD 北大核心 2013年第3期384-388,共5页 Journal of Nanjing University of Science and Technology
基金 中央高校基本科研业务费专项资金(2012SCU062) 国家"973"重大项目(2011CB301800) 中国工程物理研究院太赫兹科学技术研究中心基金(CAEPTHZ201204)
关键词 严格电磁场理论 半解析方法 亚波长单缝衍射 rigorous electromagnetic field theory semi-analytical method sub-wavelength slit diffraction
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参考文献16

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