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THE FAILURE MECHANISM OF REVERSE SHAPE MEMORYEFFECT IN A Cu-BASE ALLOY

THE FAILURE MECHANISM OF REVERSE SHAPE MEMORY EFFECT IN A Cu-BASE ALLOY
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摘要 The interior structural evolution accompanying reverse shape memory effect (RSMEin a Cu-Zn-Al alloy was studied by means of transmission electron microscopy. It was found that RSME is closely related to bainitic transformation in this alloy during the isothermal reaction at moderate temperatures. At a given temperature and a certain external constraint stress, the shape memory effect depends mainly on the aging time.During the early stage, the shape memory effect enhances with the increase of reactiotn time. Then it will decrease gradually apon further aging. If the alloy is overaged, the stacking faults of bainite will disappear gradually by the motion of partial dislocations through which long range diffusion of solute atoms takes place, giving rise to the deterioration of RSME. When all the bainite transforms to α phase, RSME will lose completely. The interior structural evolution accompanying reverse shape memory effect (RSMEin a Cu-Zn-Al alloy was studied by means of transmission electron microscopy. It was found that RSME is closely related to bainitic transformation in this alloy during the isothermal reaction at moderate temperatures. At a given temperature and a certain external constraint stress, the shape memory effect depends mainly on the aging time.During the early stage, the shape memory effect enhances with the increase of reactiotn time. Then it will decrease gradually apon further aging. If the alloy is overaged, the stacking faults of bainite will disappear gradually by the motion of partial dislocations through which long range diffusion of solute atoms takes place, giving rise to the deterioration of RSME. When all the bainite transforms to α phase, RSME will lose completely.
出处 《Acta Metallurgica Sinica(English Letters)》 SCIE EI CAS CSCD 1997年第3期203-205,共3页 金属学报(英文版)
关键词 reverse shape memory effect Cu-base alloy stacking fault BAINITE reverse shape memory effect, Cu-base alloy, stacking fault, bainite
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