摘要
A stochastic model of conducting crack propagation is presented to provide a conceptual framework dedicated to the study of the formation of fractal structure of dielectric ageing patterns as a result of a competition between random fluctuation growth and applied electric strength enhanced deterministic growth. The necessary and sufficient conditions resulting in fractal behaviour in dielectric ageing are found.
提出了导电裂纹长大的随机模型．该模型为研究分形电老化模式提供了一个概念性框架，在这一理论框架内．形成分形电老化结构是随机涨落长大和外加电应力强化确定性长大相互竞争的结果．本文还给出了在介电老化过程中产生分形结构的充要条件．
