摘要
考虑了固体电介质结构劣化的共同特点,本文从理论上表述了在宽广电场范围(10~5V/cm～击穿)作用下介质中电致陷阱产生的动力学过程,并以一级捕获动力学方程为依据,获得了包含新陷阱的陷阱捕获电子动力学特性方程,最后文中提出表面电位模型,实现了对这些动力学特性的研究,根据研究结果提出电击穿过程新模型。
Considering the common characteristics of structuredegrading in solid dielectrics,a kinetic equation of trap creationand electrons capture under the application of wide range ofelectrical fisld(from 10~5V/cm to breakdown)is deduced in thispaper.Becides a measuring technology with surface potential isproposed to study such behaviours Then a new breakdown mecha-nism is suggested by taking account of the phenomena of trapcreation and detrapping due to impacting ionization between freeelectrons and the trapped.
出处
《华南理工大学学报（自然科学版）》
EI
CAS
CSCD
1993年第1期100-107,共8页
Journal of South China University of Technology(Natural Science Edition)
关键词
陷阱
捕获电子
固体
电介击穿
solid insulating materials
traps
trapped electron
dynamics
