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高纯金属镱中杂质元素的电感耦合等离子体质谱法测定 被引量:15

Determination of Trace Impurities in High Purity Ytterbium by Inductively Coupled Plasma Mass Spectrometry
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摘要 利用电感耦合等离子体质谱仪 (ICP -MS)直接测定了金属镱中除Tm、Lu外其他稀土及非稀土杂质元素 ;通过P507 萃淋树脂色层柱 ,分离绝大部分Yb基体 ,避免了基体元素对Tm、Lu的测定干扰。定量加入内标元素Sc、Cs,有效克服了基体效应所带来的偏差。稀土杂质元素的检出限0.010~0.032μg/g,非稀土杂质元素的检出限为0.12~5.0μg/g。加标回收率为83 %~105 %。方法适用于纯度为99.99 %~99.999 A method for the direct determination of rare-earth impurities(not including Tm and Lu)and non rare-earth impurities in high purity Ytterbium by inductively coupled plasma mass spectrometry(ICP-MS)was reported.The Yb matrixinterference effect on Tmand Lu was eliminated by using the P 507 extraction chroˉmatographic column to separate Tm and Lu from Yb matrix and the matrix effect was suppressed by using Sc and Cs as internal standards.The detection limits for the rare-earth impurities were0.010~0.032μg/g and for the non-rare-earth impurities were0.12~5.0μg/g.The recovery of standard addition was83%~105%.The method has been applied to the determination of trace impurities in Ytterbiumsamples with purity of99.99%~99.999%.
出处 《分析测试学报》 CAS CSCD 北大核心 2004年第6期73-76,共4页 Journal of Instrumental Analysis
关键词 杂质元素 电感耦合等离子体质谱 高纯稀土金属 Yb Impurity elements ICP-MS High purity rare earth metal
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