摘要
介绍了目前国内各种缺陷测高的方法,分析了各自优缺点,指出开发便携式缺陷测高仪的重大意义 说明了便携式缺陷测高仪的设计原理,分析了仪器开发的技术关键和开发中遇到的问题,并提出了相应的解决方法,同时提出仪器软、硬件设计思想。仪器具有高效、精确、简便等优点。
All of the traditional methods for measuring flaw height are introduced and their defects are analysed in this article. The importance of developing a portal flaw measuring apparatus is indicated. The principle of the developing apparatus is put forward and some key problems that will be met in the research are point out as well resolvent is put forward. Some design plan about hardware and software is indicated. This apparatus is high efficient and precise and as well as simple and convenient.
出处
《中国仪器仪表》
2004年第12期22-24,共3页
China Instrumentation
