摘要
利用原子力显微镜技术、表面压松弛法对带相反电荷高分子和表面活性剂在气 /水界面形成的界面复合物膜进行了特性研究 .原子力显微镜研究结果表明 ,部分水解聚丙烯酰胺 (HPAM) /十六烷基三甲基溴化铵 (CTAB)所形成的界面复合物膜呈现出“团”状聚集体形貌 .两性聚丙烯酰胺与 CTAB形成的界面复合物膜呈现出“纤维丝”的聚集体形貌 .亚相中盐的存在对界面复合物的形貌有很大影响 .表面压松弛实验则进一步表明界面复合物膜形貌结构的变化对其膜稳定性有直接的影响 .
Atomic force microscopy(FAM) and the surface pressure relaxation technique were employed to characterize the properties of oppositely charged polymer/surfactant complex films formed on the air/water interface. By the observation of AFM, it is shown that partially hydrated polyacrylamide(HPAM)/hexadecyltrimethylammonium(CTAB) complex films appear in the morphology of patch aggregates. Amphoteric HPAM/CTAB complexes are observed to form filbrelike structures. Salts in the subphase have an impact on the morphology of interface complexes. Furthermore, the surface pressure relaxation revealed that the conformational changes of interface complexes are directly related to the stability of the films.
出处
《高等学校化学学报》
SCIE
EI
CAS
CSCD
北大核心
2005年第2期281-284,共4页
Chemical Journal of Chinese Universities
基金
国家自然科学基金 (批准号 :90 2 0 70 2 6)资助
关键词
原子力显微镜
表面压松弛
界面复合物膜
膜稳定性
Atomic force microscopy(FAM)
Surface pressure relaxation
Interface complex film
Stability of film
