期刊文献+

纳米薄膜X射线吸收光谱的鉴定

Characteristics of X-ray absorption on nanoscale thin films
下载PDF
导出
摘要 采用X射线吸收光谱研究了热丝化学气相沉积 (CVD)合成的纳米金刚石薄膜和脉冲激光沉积的纳米SiC薄膜。结果表明 :纳米金刚石薄膜的碳K边X射线吸收精细结构光谱显示的激发峰相当于微米金刚石薄膜的蓝移 ,是量子效应的显著特征 ,证明制备的是纳米金刚石薄膜 ,与高分辨透射电镜的结果完全吻合 ;纳米SiC薄膜的硅K边X射线吸收精细结构光谱和扩展X射线吸收精细结构光谱也显示了纳米薄膜短程有序的结构特征 。 Nanodiamond films synthesized by hot-filament chemical vapor deposition method and SiC nanoscale thin film deposited by pulsed laser deposition were investigated by X-ray absorption spectroscopy. The results show that C K-edge NEXAFS of the nanodiamond film exhibits a blue-shifted exciton peak relative to that of microscale diamond film. These features are characteristics of quantum confinement behavior. The results confirm the presence of nanodiamond film as revealed by transmission electron microscopy. The Si K-edge NEXAFS and EXAFS of the SiC nanoscale thin film also exhibit a significant long-range disorder that is the character of nanoscale materials, i.e. the SiC thin film is a nanoscale thin film.
出处 《中国有色金属学报》 EI CAS CSCD 北大核心 2004年第12期2043-2048,共6页 The Chinese Journal of Nonferrous Metals
基金 美国国家科学基金 (DMR 0 0 844 0 2 )
关键词 纳米薄膜 X射线吸收光谱 纳米金刚石 蓝移 nanoscale thin film X-ray absorption spectroscopy nanodiamond blue-shift
  • 相关文献

参考文献33

  • 1Takagahara T. Effects of dielectric confinement and electron-hole exchange interaction on excitonic states in semiconductor quantum dots[J]. Phys Rev B, 1993,47(8): 4569 -4584.
  • 2Rossetti R, Nakahara S, Brus L E. Quantum size effects in the redox potentials, resonance Raman spectra, and electronic spectra of Cds crystallites in aqueous solution[J]. J Chem Phys, 1983, 79(2): 1086-1088.
  • 3Awschalom D D, McCord M A, Grinstein G. Observation of macroscopic spin phenomena in nanometerscale magnets[J]. Phys Rev Lett, 1990, 65(6): 783 -786.
  • 4李泉,曾广赋,席时权.纳米粒子[J].化学通报,1995(6):29-34. 被引量:143
  • 5韩顺昌.纳米材料的结构特性及其表征[J].材料开发与应用,1998,13(1):36-40. 被引量:24
  • 6彭明生,李迪恩,林冰,梁金龙.同步辐射X射线吸收谱及其在矿物学、地球化学中的应用[J].矿物岩石地球化学通报,1999,18(1):35-39. 被引量:12
  • 7Waychunas G A, Brown G E. X-ray K-edge absorption spectra of Fe minerals model compounds( Ⅱ )-EXAFS[J]. Phys Chem Minerals, 1986, 13: 31-47.
  • 8Hedgson K O, Hedman B, Penner-Hahn J E. EXAFS and Near-Edge Structure( Ⅲ ) [M]. Berlin: SpringerVerlag, 1984.
  • 9Gurevich A B, Bent B E, Teplyakov A V, et al. A NEXAFS investigation of the formation and decomposition of CuO and Cu2O thin films on Cu(100)[J].Surface Science, 1999, 442: L971- L976.
  • 10Ramm M, Ata M, Brzezinka K W, et al. Studies of amorphous carbon using X-ray photoelectron spectroscopy, near-edge X-ray-absorption fine structure and Raman spectroscopy [J]. Thin Solid Films,1999, 354: 106-110.

二级参考文献6

共引文献176

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部