摘要
采用激光散射层析术及 X 射线形貌术研究了 KDP(KH_2PO_4)晶体中散射颗粒及位错等缺陷的形成机理。作者采用微分干涉衬差显微镜(DICM)装置、通过录相放大系统观察研究了晶体生长过程中有机和无机固态包杂物的成因。
The formation mechanism of defects such as Scattering particles and dislocationsin KDP crystals was investigated using laser beam scattering tomography and X-ray topography.The formation of organic and inorganic solid inclusions duringgrowth was investigated using differential interference contrast microscopy (DICM)combined with amplification via a video system.
出处
《无机材料学报》
SCIE
EI
CAS
CSCD
北大核心
1989年第2期108-111,共4页
Journal of Inorganic Materials
关键词
KDP晶体
磷酸二氢钾
位错
Crystal
Dislocation
Inclusion
In situ observation
Laser scattering tomography
X-ray topograph
Laser damage
