摘要
原位金属基复合材料的增强颗粒是在基体中原位生成,因而增强颗粒和基体间不存在界面反应,两者间为直接的原子结合。界面对原位金属基复合材料的性能有着重要的影响。本文综述了扫描电子显微镜、普通透射电子显微镜、高分辨电子显微镜和电子能量损伤谱仪等现代电子显微技术在原位金属基复合材料界面研究中的应用及部分研究结果。利用现代电子显微技术和先进的实验方法在原子尺度上对界面的精细结构、结合方式、界面缺陷、界面稳定性及其影响因素等进行研究,从而在较深的层次上认识原位金属基复合材料的界面,对在该领域做进一步研究探讨起到促进作用。
Reinforcements of in situ metal matrix composites (MMCs) are formed in situ by exothermal reactions between elements or between elements and compounds, so the interfaces between particulates and the matrix are clean and free from any interfacial phase. Interfaces play an important role for properties of in situ MMCs. In this article, the application of electron microscopy (SEM, TEM, HREM and EELS) in the study of composite interface is discussed and part of research results is presented. Experiment results indicate that electron microscopy and advanced technology can be used to investigate the interface from microstructure, combining mode, defect, and stability in atomic scope. By means of electron microscopy, we can apprehend the interface of in situ MMCs in more detail.
出处
《铸造技术》
EI
CAS
北大核心
2005年第5期431-434,共4页
Foundry Technology
基金
广西科学基金资助项目
编号:桂科自0339002
