期刊文献+

一种对测试频率不敏感的模拟电路多频参数识别方法

A Multi-frequency Parameter Identification Method for Analog Circuits with Results Insensitive to Test Frequency
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摘要 在模拟电路的多频参数识别方法中,一般都存在诊断方程的解对测试频率敏感的问题。针对文献[1]中的多频参数识别方法,提出了2种克服诊断方程对测试频率敏感的技术。并对提出的方法进行了电路仿真验证。 As to multifrequency parameter identification for analog circuits, the solution of diagnosis equation is quite sensitive to testing frequency.In this paper two techniques are introduced to reduce the dependence of diagnosis equation on testing frequency for the method presented by reference [1]. The results of simulation validated effectiveness of the proposed methods.
作者 邹晓松
出处 《现代电子技术》 2005年第10期94-96,共3页 Modern Electronics Technique
关键词 识别方法 测试频率 模拟电路 多频 敏感 诊断方程 仿真验证 analog circuits fault diagnosis parameter identification sensitivity analysis
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参考文献5

  • 1邹晓松,罗先觉.模拟电路的多频灵敏度故障诊断方法[J].微电子学与计算机,2004,21(4):109-112. 被引量:7
  • 2Slamani M, Kaminska B. Analog Circuit Fault Diagnosis Based on Sensitivity and Functional Testing[J].IEEE Trans. Design and Test of Computers, 1992, 9(1): 30-39.
  • 3Michael Tian W,Richard Shi C J. Worst Case Tolerance Analysis of Linear Analog Circuits Using Sensitivity Bands[J]. IEEE Trans. on Circuits and Systems-I: Fundamental Theory and Applications,2000,47(8):1 138-1 145.
  • 4Cesare Alippi,Marcantonio Catelani,Ada Fort,et al. SBT Soft Fault Diagnosis in Analog Electronic Circuits: A Sensitivity-Based Approach by Randomized Algorithms[J]. IEEE Trans. on Instrumentation and Measurement,2002,51(5):1 116-1 125.
  • 5Feng Li,Peng-Yung Woo. The Invariance of Node-Voltage Sensitivity Sequence and Its Application in a Unified Fault Detection Dictionary Method[J]. IEEE Trans. on Circuits and Systems-I: Fundamental Theory and Applications,1999,46(10):1 222-1 227.

二级参考文献5

  • 1John W Bandler, Aly E Slamama. Fault Diagnosis of Analog Circuits. Proc. IEEE, 1985,73(8): 1295-1307.
  • 2杨士元.模拟系统的故障诊断与可靠性设计.清华大学出版社.1993:52-75.
  • 3M Slamani, B Kaminska. Analog Circuit Fault Diagnosis Based on Sensitivity and Functional Testing. IEEE Trans.Design and Test of Computers, 1992,9(1): 30~39.
  • 4K Saab, D Marche, et al. LIMSoft:Automated Tool for Sensitivity Analysis and Test Vector Generation. IEEE Proc.Circuits Devices Syst, 1996,143(6): 386~392.
  • 5朱明英,李于凡.模拟电路双重故障的单端检测[J].华南理工大学学报(自然科学版),1999,27(1):10-13. 被引量:2

共引文献6

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