摘要
概括介绍了胶体Zeta电位测试的基本原理与测试仪器的发展,重点介绍了基于多普勒电泳光散射原理的新型Zeta电位分析仪。以Zetasizer Nano电位分析仪为例,阐述了其测试原理,分析了电渗运动、交叉污染、展宽、信噪比等影响其测试精度的主要因素,并详细阐述了该电位仪所采用的专利测试新技术———M3-PLAS技术和折叠式毛细管样品池技术,最后展望了Zeta电位分析仪的应用前景。
Basic accepts of Zeta potential and its measurement mechanism is briefly introduced in this paper.Zeta potential analyzer based on the principle of Laser Doppler Velocimetry (LDV) is introduced in detail.Take Zetasizer Nano for example, factors affecting the accuracy of measurement such as electroosmosis effect, cross contamination and shoulder width are discussed.New patent techniques of Zeta potential analyzer such as M3-PALS and folded capillary cell are also discussed.Finally, prospect of this new equipment is briefly concluded.
出处
《中国测试技术》
2005年第4期20-23,共4页
CHINA MEASUREMENT & TESTING TECHNOLOGY
