期刊文献+

用投影光栅测量三维物体表面形状

TO MEASURE SURFACE OF A 3-D OBJECT BY PROJECT GRATING
下载PDF
导出
摘要 详细分析了投影光栅的频谱结构、位相信号的频率范围及背景亮度等因素对测量精度的影响,提出了光栅周期、滤波器通频带及光栅信号幅度的选择范围。 It is a significant and practical detection technique to untouchedly measure thesurface of 3-D object by using project grating. Several factors, coming from the frequency spectrum of the grating,the frequency range of the phase signal and the background luminance,which may exert an influence on the measurement accuracy, are analyzed in detail.The periodof the grating,the range of band filter and the amplitude of grating signal are also discussed .
出处 《北京师范大学学报(自然科学版)》 CAS CSCD 1995年第2期207-211,共5页 Journal of Beijing Normal University(Natural Science)
基金 江苏省自然科学基金
关键词 投影光栅 调制 频谱 滤波 三维信息 表面形状 project grating modulation, frequency spectrum filtering
  • 相关文献

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部