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K在InP(100)表面吸附及界面反应的同步辐射光电子能谱研究

Synchrotron Radiation Photoemission Study of Chemisorption and Interaction at the K/InP(100) Interface
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摘要 利用同步辐射光电子能谱研究了K在p型InP(100)表面的吸附及其界面反应.由K吸附过程中In4d和P2p芯能级谱的变化发现:在碱金属K吸附于p型InP(100)表面的过程中,K—P之间发生了化学反应,形成K—P化合物,当K覆盖度0>210Sec时稳定的K—P化合物基本形成,此时P2p峰的峰形和峰位基本保持不变.K—In之间无明显的化学反应发生,但在K的吸附过程中,碱金属K对In有置换反应发生,使In偏析到InP(100)的表面.InP(100)表面的K吸附层引起了能带弯曲.能带弯曲的值为0.75eV.偏析到InP(100)表面的In的悬挂键空态被来自于碱金属K的外层电子所填充,形成一个半满的表面态.正是这个半满的表面态是引起能带弯曲和Fermi能级钉扎。 Abstract The room temperature adsorption of K on p-type InP(100) has been studied with use of synchrotron radiation core-level spectroscopy. From the coverage dependent In 4d and P 2p core-level spectra, we found that in the process or K adsorption on InP(100), the reaction between K and P is observed and K-P compound is formed. When the K coverage 0 > 210 Sec.,the stable K-P compound is formed. Meanwhile, the peak position and peak shape of P 2p shows no change. No reaction occurs between K and In, and in the process of K adsorption on InP(100) surface, the in of substrate is exchanged into surface by K. The K adsorption leads to band bending: The empty state of dangling bond of in (exchanged by K) was filled by the our-shell electrons of K, formed a half-filled surface state. The fermi-level shift and pinning was caused by this half-filled surface state.
出处 《Chinese Journal of Chemical Physics》 SCIE CAS CSCD 1995年第3期263-268,共6页 化学物理学报(英文)
基金 国家自然科学基金
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