摘要
用ｘ射线衍射最小二乘法测定ＺＳＭ－５分子筛的晶胞参数，经ＺＳＭ－５分子筛硅铝比与晶胞参数关联的经验公式，得到ＺＳＭ－５分子筛的硅铝比。试验结果表明，该方法测定的ＺＳＭ－５分子筛硅铝比比通常采用的化学分析方法省时、简便、重复性好。
The angle of every diffraction line of ZSM-5 molecular sieve determinedby X-raydiffraction, we obtained accurate lattice constant by using the least square method, and SiO_2/Al_2O_3 ratio of ZSM-5 molecular sieve according to empirical formula of lattice constant connectedwith SiO_2/Al_2O_3 ratio. The results have justified that the method is simpler and more convenient,better repeatable than other methods of chemical analysis.
出处
《石油化工》
CAS
CSCD
北大核心
1995年第7期498-499,506,共3页
Petrochemical Technology
关键词
分子筛
硅铝比
X射线衍射
测定
XRD,ZSM-5 molecular sieve,SiO_2/Al_2O_3 ratio
