摘要
利用高性能的C 8051F 020单片机设计了一种核谱测量系统,系统与微机连接实现了谱数据的实时采集。直接利用C 8051F 020已经封装的一个12位的100kH z的逐次逼近型ADC,两路12位的电压型DAC中的一路,片上的4k字节XRAM,加上过峰检测电路构成多道分析系统。利用C 8051F 020上ADC 0的差分输入,一路为输入信号,一路为DAC 0的输出,实现滑尺,可以明显地改善测量谱仪的微分非线性。用N aI(T l)探测器的信号作测试,实测了137C s的谱图。
This paper introduces applying of C8051F020 MCU and constructing nuclear spectrum acquisition system. Because C8051F020 has a 12bits 100kSPS successive ADC, and two 12 bits voltage DAC, 4kbytes XRAM ,it＇s easy to construct a nuclear spectrum acquisition system with a peak detecting circuit . The ADC is programmed in differential mode ,and one DAC is used . DAC＇s output is connected to the ADC＇s negative input to make an eliminating differential nonlinearity error circuit . And the system is tested with a NaI（T1）γ detector using 137Cs.
出处
《核电子学与探测技术》
CAS
CSCD
北大核心
2005年第5期515-518,共4页
Nuclear Electronics & Detection Technology
关键词
滑尺
核谱测量
C8051F020
微分非线性
死时间
smoothen saw teeth
nuclear spectrum collecting
C8051F020
differential nonlinearity
dead
