摘要
XRD, Raman, TEM, and N2-adsorption were utilized to characterize CeO2/SiO2 prepared by coprecipi-tation and surfactant-assisted method. The results show that nanocrystalline CeO2 can be uniformly supported on the surface of SiO2 particles, when the molar ratio of Si4+/(Ce3++Si4+) is less than 35% in coprecipitation samples. At higher Si content, the surface of SiO2 can not be fully covered by CeO2. With surfactant (CTAB) added, the u-iformly supported structure can even exist when the molar ratio of Si4+/(Ce3++Si4+) is as high as 53%. It is because Ce and Si complexes can be well dispersed in precursor solution in present of CTAB. However, the uniformly supported structure can not be synthesised through surfactant-assisted approch for its hydrothermal threatment, which can easily lead to separate aggregation of nanocrystalline CeO2 and SiO2 particles.
XRD, Raman, TEM, and N2-adsorption were utilized to characterize CeO2/SiO2 prepared by coprecipitation and surfaetant-assisted method. The results show that nanocrystalline CeO2 can be uniformly supported on the surface of SiO2 particles, when the molar ratio of Si^4＋/（Ce^3＋＋Si^4＋） is less than 35% in eoprecipitation samples. At higher Si content, the surface of SiO2 can not be fully covered by CeO2. With surfactant （CTAB） added, the uiformly supported structure can even exist when the molar ratio of Si^4＋（Ce^3＋＋Si^4＋） is as high as 53%. It is because Ce and Si complexes can be well dispersed in precursor solution in present of CTAB. However, the uniformly supported structure can not be synthesised through surfactant-assisted approch for its hydrothermal threatment, which can easily lead to separate aggregation of nanoerystalline CeO2 and SiO2 particles.
出处
《无机化学学报》
SCIE
CAS
CSCD
北大核心
2005年第11期1705-1709,共5页
Chinese Journal of Inorganic Chemistry
基金
云南省省校联合项目(No.2003BAACA00A036)资助。
关键词
CeO2/SiO2
均匀负载
共沉淀法
模板法
CeO2/SiO2
uniformly supported structure
coprecipitation
surfactant-assisted method
