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扫描探针显微镜测壳聚糖材料的表面电荷分布 被引量:7

Measurement of Chitosan Material Surface Charge Distribution Using Scanning Probe Microscope
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摘要 提出一种测量材料表面电荷是非均匀的、没有中性区的弱电荷的方法。即测试时,利用扫描探针显微镜(SPM)的静电力显微镜(EFM)测量技术,依靠轻敲模式(TappingMode)和抬举模式(LiftMode),用相位成像测量有机高分子膜———壳聚糖膜(CHI)的表面电荷密度空间分布,但由于仪器设计中相位的泰勒展开是:sinΔΦ≈1/2ΔΦ,所以所获的电荷图像只能确定材料的表面电荷分布和表面电荷密度的近似值。然而,嵴宽约为2.12μm表面正电荷微沟槽结构的这种特殊电荷形貌分布有利于细胞的生长,因此获得的表面电荷分布补充了生物材料表面理化性质。 In the paper, one way is put forward to measure the surface charge density on materials, which is very weak, whose distribution is not even and where there is no neutral region. Namely, during the experiment, using Electric Force Microscopy (EFM) in Scanning probe microscopy (SPM) by Tapping Mode and Left Mode the spacial distribution of the surface charging density of the organic macromolecule film was measured by the phase images, such as chitosan film (CHI). At the same time, due to the design of SPM contains unwillingly certain approximation-sin△Ф is about equal to 1/2△Ф using the Taylor expansion, the obtained electric charge image on the film surface can only determine its surface charging density distribution and the approximation of the surface trapped charging density. However, the microgrooved structure of surface charge distribution is favorable to promoting nerve cell growth, especially when the distance is about 2. 12μm between adjacent positive charge peaks on the material surface. Therefore, the obtained surface charging density distribution supplies the surface physicochemical properties of biomaterials.
出处 《材料科学与工程学报》 CAS CSCD 北大核心 2005年第5期605-608,共4页 Journal of Materials Science and Engineering
基金 贵州省科学技术基金资助项目(20033004) 贵州民族学院基金资助项目.
关键词 SPM EFM 表面电荷分布 表面束缚电荷密度 表面形貌 壳聚糖膜(CHI) SPM EFM surface charging density distribution surface trapped charging density surface topography CHI
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  • 1蒋挺大.甲壳素[M].北京:中国环境科学出版社,1994.117.
  • 2杨飞 杨吟野 等.γ-射线辐照对壳聚糖薄膜的改性研究.第七届生物材料年会[M].扬州,2000..

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