期刊文献+

IC制造中清洗技术发展的分析 被引量:6

Analysis of Development for Cleaning Technique on IC Manufacture
下载PDF
导出
摘要 概述了半导体制造中清洗技术所面临的挑战及生产中存在的问题,分析了解决问题的途径,讨论了当前IC制造中关键清洗技术的发展方向。对于国产清洗设备制造业的发展提出了自己的看法。 The new challenge and issues of the cleaning technique in IC manufacturing are introduced. The ways for solving the problems are analyzed, and the key techniques developing trends are discussed. Suggestions for developing cleaning equipment were proposed.
作者 盛金龙
出处 《半导体技术》 CAS CSCD 北大核心 2006年第3期166-169,共4页 Semiconductor Technology
关键词 IC制造 清洗技术 挑战 IC manufacture cleaning technique challenge
  • 相关文献

参考文献5

  • 1QUIRKS M,SERDA J.Semiconductor Manufacturing Technology[M].Pearson Education,Inc.,2001.
  • 2MOUCHE L,TARDIF F.Mechanisms of metallic impurity deposition on silicon substrates dipped in cleaning solutions[J].J Electrochemical Soc,1995,142(7):2395-2401.
  • 3何良恩,凤坤,唐雪林,李刚.对抛光片清洗技术的研究[J].半导体技术,2004,29(7):14-17. 被引量:4
  • 4李仁.半导体IC清洗技术[J].半导体技术,2003,28(9):44-47. 被引量:29
  • 5BRAUN A E.Photostrip faces 300mm,copper and lowk convergence[J].Semiconductor International,2000,23(10):78-90.

二级参考文献7

  • 1MOUCHE L,TARDIF F,DERRIEN J,et al.Mechanisms of metallic impurity deposition on silicon substrates dipped in cleaning solutions[J].J Electrochemical Soc,1995,142(7):2395.
  • 2ITANO M,KERN F W,MIYASHITA M,et al.Particle deposition and removal in wet cleaning processes for ULSI manufacturing[J].IEEE Trans on Semiconductor Manufacturing,1992,5(2):114-120.
  • 3KEN W.The evolution of silicon wafer cleaning technology[J].J Electrochem Soc,1990,137(6):1887.
  • 4OKUMURA H,AKANE T,TSUBO Y,et al.Comparison of conventional surface cleaning methods for Si molecular beam epitaxy[J].J Electrochem Soc,1997,144(11):3765.
  • 5HABUKA H,TSUNODA H,MAYUSUMI M,et al.Roughness of Silicon Surface Heated in Hydrogen Ambient[J].J Electrochem Soc,1995,142(9):3092..
  • 6WENDT H,CERVA H,LEHMANN V.et al.Impact of copper contamination on the quality of silicon oxides[J].J Appl phys,1989,65(6):2402.
  • 7曹宝成,于新好,马瑾,马洪磊,刘忠立.用含表面活性剂和螯合剂的清洗液清洗硅片的研究[J].Journal of Semiconductors,2001,22(9):1226-1229. 被引量:16

共引文献30

同被引文献25

引证文献6

二级引证文献14

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部