摘要
用高精度IPC-205B型扫描隧道显微镜测得纳米碳酸钙的扫描隧道谱。该隧道谱表明,纳米碳酸钙具有半导体性质,与普通碳酸钙相比,其导电性能有了明显改善。由纳米碳酸钙隧道谱得出纳米碳酸钙的禁带宽度为0.4eV,比半导体硅的禁带宽度1.1eV的低。
In this paper, the STS of nanometer CaCO3 is obtained by STM. IPC-205B. The result shows that detection of some insulated nanophase materials by STM. IPC-205B, which we developed ourselves, of nanometer CaCO3 by STM presents conductibility well if they are thin enough and located in a proper bias voltage field In this way, the forbidden band breadth （0.4eV） of nanometer CaCO3 can being known from the STS of nanometer CaCO3. And we find that the forbidden band breadth of nanometer CaCO3 is lower than that of semiconductor Si（1.1eV）.
出处
《理化检验（物理分册）》
CAS
2006年第3期129-130,133,共3页
Physical Testing and Chemical Analysis(Part A:Physical Testing)
