摘要
采用熔融-急冷法制备CdS掺杂Ge-Ga-S硫系玻璃,对玻璃的XPS研究表明:玻璃样品中含有Ge, Ga,Cd,S4种元素,样品的主要成分是GeS2,Ga2S3和CdS;Ge,Ga,Cd,S元素的XPS谱线的位移归因于化学位移和玻璃的结构的共同作用;Cd3d3/2和Cd3d5/2的XPS峰值随CdS含量的增加而明显增强。
In this paper, Ge- Ga- S chalcogenide glass doped with CdS was prepared by melt- sharp cooling method. The XPS analysis of the glass showed that the sample contains four elements： Ge, Ga, Cd, S, the main components are GeS2, Ga2S3 and CdS. The displacement of the XPS spectrum of Ge, Ga, Cd, S was due to both the chemical shifts and the structure of glass. The XPS peak value of Cd3d3/2 and Cd3d5/2 enhanced obviously with the increasing content of CdS.
出处
《硅酸盐通报》
CAS
CSCD
北大核心
2006年第1期69-71,共3页
Bulletin of the Chinese Ceramic Society
