摘要
利用电子束蒸发工艺,以Ag层为衬底,沉积了中心波长为632·8nm的氧化锆(ZrO2)薄膜,膜层厚度在80—480nm范围内变化.研究了不同厚度样品的粗糙度变化规律和表面散射特性.结果发现,随着膜层厚度的逐渐增加,其表面均方根(RMS)粗糙度和总积分散射(TIS)均呈现出先减小后增大的趋势.利用非相关表面粗糙度的散射模型对样品的TIS特性进行了理论计算,所得结果与测量结果相一致.
Zirconium oxide （ZrO2 ） coatings for 632.8nm center wavelength were deposited on the Ag layer by electron beam evaporation, optical thickness of which varied in the range of 80-480nm. Surface roughness and scattering characteristics of ZrO2 coatings with different thickness were investigated. It was found that with the gradually increase of the thickness, both roughness and total integrated scattering （TIS） of the samples decreased firstly and then increased. These results indicated that TIS of the samples mainly depended on the surface roughness. According to the uncorrelated surface roughness scattering model, scattering properties of the samples were analyzed theoretically. The calculated TIS values based on this model agreed well with that obtained by TIS measurements.
出处
《物理学报》
SCIE
EI
CAS
CSCD
北大核心
2006年第6期3124-3127,共4页
Acta Physica Sinica
关键词
氧化锆
表面粗糙度
标量散射
电子束蒸发
ZiO2 coatings, surface roughness, scalar scattering, electron beam evaporation
