摘要
本文介绍研究固体、表面及薄膜的光学和热学特性的一种十分灵敏的探测技术．这一探测技术──光热位移光谱，是基于对样品表面吸收电磁辐射后所引起的热膨胀的测量。本技术亦适用于那些要求高真空和温度变化范围较大条件的实验研究工作。这种光谱技术还能将面吸收和体吸收很好的区分开来，入射功率面的吸收的测量能达到αｌ＝１０￣（－６）／Ｗ．
In this paper, a sensitive technique for determining the optical and thermal properties ofsolids surfaces and thin films is presented.This technique, photothermal displacement spectroscopy,isbased on the detection of the thermal expansion of a sample upon absorption of electromagneticradiation. The technique is well suited for in situ ultrahigh vacuum studies and for experiments wherewide temperature ranges are required. We show that surface and bulk optical absorption can bedistinquished and that surface absorptions of αl= 10￣(-6)/W incident power can be measured。
出处
《光子学报》
EI
CAS
CSCD
1996年第7期585-588,共4页
Acta Photonica Sinica
关键词
热膨胀系数
光学特性
光热位移光谱
Thermal expansion
Diffusion length
Pump beam
Photothermal displacementspectroscopy
Evanescent
