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一个与马铃薯青枯病抗性连锁的SRAP标记筛选 被引量:39

Identification of a SRAP Marker Linked to Bacterial Wilt Resistance in Diploid Potato
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摘要 以两个马铃薯二倍体分离群体ED和CE共105个基因型为材料,利用群分法(BulkedSegregantAnalysis,BSA)筛选与马铃薯青枯病抗性基因连锁的分子标记。在8个正向引物和11个反向引物组成的88对SRAP引物组合中,筛选获得了一个与马铃薯青枯病抗性紧密连锁的SRAP标记M32,遗传连锁分析表明,该标记在ED群体和CE群体中与抗性位点之间的遗传距离分别为10.2cM和17.3cM。 In this paper, bulked segregant analysis was used to identify SRAP markers linked to bacterial wih resistance in the two segregating populations (CE and ED) of diploid potato. A SRAP marker M32 linked to resistant gene RBW, was screened from 88 pairs of combination with 8 forward primers and 11 reverse primers. The genetic distance between the M32 and site of bacterial wilt resistance was 10.2 cM and 17.3 cM in ED and CE population, respectively,
作者 雷剑 柳俊
出处 《中国马铃薯》 2006年第3期150-153,共4页 Chinese Potato Journal
基金 国家"863"项目(2003AA207130)
关键词 马铃薯 青枯病 SRAP标记 potato bacterial wilt SRAP marker
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参考文献8

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