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一种基于智能蚁群算法的SOC芯核测试调度方法 被引量：1

A method for IP block test allocate and optimum based on SOC
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摘要 随着现代半导体技术的发展，将整个系统集成在一个芯片上成为可能．但系统集成芯片SOC的测试也成为一项越来越艰巨的工作。文章采用一种改进的智能蚁群算法来解决SOC中芯核测试调度问题，在带宽一定的条件下，利用智能蚊群算法的特性，考虑各种资源约束，动态地寻找最优调度方法，并且在调度过程中，动态的更新信息．与模拟退火算法相比较，该方法降低了测试时间，得到较好的效果． With the development of modem IC technology, it＇s available to integrate the whole system on a single chip. In the mean time, the testing of SOC becomes a more complicated work. In this paper, a new method based on intelligent ant colony system for test resource allocate is studied. Under the constraint of bandwidth, considering the characteristics of intelligent ant colony system and other resource constraints, the optimal result is searched dynamically. Besides, the information is updated in the process. This method reduces the test time, and shows a good efficiency.
作者 王冠军 马光胜 刘晓晓 王茂励
机构地区 哈尔滨工程大学计算机科学与技术学院 哈尔滨工程大学自动化学院
出处 《哈尔滨工程大学学报》 EI CAS CSCD 北大核心 2006年第B07期514-517,共4页 Journal of Harbin Engineering University
关键词 片上系统 智能蚁群 测试访问机制 测试资源调度 测试资源优化 SOC ACO TAM test resource allocate test resource optimization
分类号 TP24 [自动化与计算机技术—检测技术与自动化装置]
  • 相关文献

参考文献7

  • 1WU Chengwen.S OC Testing methodology and Practice[J].Automation and Test in Europe Conference and Exhibition (DATE'05) proceedings,2005,2:1120-1121.
  • 2吴超,王红,杨士元.基于复用的SOC测试集成和IEEEP1500标准[J].微电子学,2005,35(3):240-244. 被引量：12
  • 3IEEE P1500 Standard for Embedded Core Test[EB/OL].http://grouper.ieee.org,groups.
  • 4胡瑜,韩银和,李晓维.SOC可测试性设计与测试技术[J].计算机研究与发展,2005,42(1):153-162. 被引量：42
  • 5DORIGOM,MANIEZZOV,COLOMIA.Positive Feedback as a Search Strategy[R].[s.l.]:Technical Report,1991.
  • 6张军英,敖磊,贾江涛,高琳.求解TSP问题的改进蚁群算法[J].西安电子科技大学学报,2005,32(5):681-685. 被引量：25
  • 7CHENG K L,HUANG J R,WANG C W.An SOC test integration platform and its industrial realization[A].in Proc.Int.Test Conf.(ITC)[C].[sl.],2004.

二级参考文献87

  • 1韩银和,李晓维,徐勇军,李华伟.应用Variable-Tail编码压缩的测试资源划分方法[J].电子学报,2004,32(8):1346-1350. 被引量：27
  • 2F. Beenker, et al.Macro testing: Unifying IC and board test.IEEE Design & Test of Computers, 1986, 4(6) : 26--32.
  • 3R. Rajsuman. Design and test of large embedded memories: An overview. IEEE Design & Test of Computers, 2001, 18(3) : 17-27.
  • 4R. Nair. Comments on an optimal algorithm for testing stuck-at faults in random access memories. IEEE Trans. on Computers,1979, 28(3): 258-261.
  • 5D. S. Suk, S. M. Reddy. A march test for functional faults in semiconductor random-access memories. IEEE Trans.Computers, 1981, 30(12): 982 -985.
  • 6M. Marinescu. Simple and efficient agorithms for functional RAM testing. In: Proc. of Int'l Test Conf.Philadelphia: IEEE Press, 1982. 236-239.
  • 7L. Chen, S. Dey. Software-based self-testing methodology for processor cores. IEEE Trans. on Computer-Aided Design of Integrated Circuits and Systems, 2001, 20(3): 369--380.
  • 8E. Marinissen, R. Arendsen, G. Bos, et al. A Structured and scalable mechanism for test access to embedded reusable cores. In:Proc. of Int'l Test Conf.. Washington: IEEE Press, 1998. 284-293.
  • 9P. Varma, S. Bhatia. A Structured test re-use methodology for core-based system chips. In: Proc. of Int'l Test Conf.Washington: IEEE Press, 1998. 294- 302.
  • 10The National Technology Roadmap for Semiconductors(ITRS),1997 Edition, Semiconductor Industry Association, 1997.http://public.itrs.net.

共引文献74

同被引文献14

  • 1汪滢,王宏,李辛毅.基于遗传算法的SOC测试功耗与时间协同优化[J].仪器仪表学报,2006,27(z3):2327-2328. 被引量：4
  • 2胡瑜,韩银和,李晓维.SOC可测试性设计与测试技术[J].计算机研究与发展,2005,42(1):153-162. 被引量：42
  • 3CHA KRABARTY K. Test scheduling for core-based systems using mixed-integer linear programming [ J ]. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2000,19(10) :1163-1174.
  • 4IYENGAR V, CHAKABARTY K, MARINISSEN E J. Test wrapper and test access mechanism co-optimization for system-on-chip [ J ]. Electronic Testing: Theory and Applications, 2002,18 ( 3 ).
  • 5GIRl CH, TIPPARTHI D K R, CHATTOPADHYAY S. Genetic algorithm based approach for hierarchical SOC test scheduling[ J]. Proceedings of the International Conference on Computing: Theory and Applications ( ICCTA 07 ) 0-7695-2770-1/07. 2007.
  • 6CHAITOPADHYAY S, SUDARSANA REDDY K. Genetic algorithm based test scheduling and test access mechanism design for system-on-chips [ C ]. 16th International Conference on VLSI Design ( VLSI' 03 ), 2003 : 341-346.
  • 7HANK H, KIM J H. Quantum-inspired evolutionary algorithm for a class of combinatorial optimization [ C ]. IEEE Transactions on Evolutionary computing, 2002: 580-593.
  • 8SUN J, FENG B, XU W B. Particle swami optimization with patti, des having quantum behavior[ J]. Proceedings of 2004 Congresson Evolutionary Computation, 2004: 325-331.
  • 9SUN J. A global search strategy of quantum-behaved particle swarm optimization [ C ]. Proc. 2004 Congress on Cybernetics and Intelligent Systems.
  • 10XU CH P, ZHANG J. Test scheme of SOC test with multi-constrained to reduce test time [ C ]. Journal of Guilin Institute of Electronic Technology, 2009, 1673-808X.

引证文献1

二级引证文献28

哈尔滨工程大学学报
2006年 第B07期

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