摘要
在清华大学喷气Z箍缩平台上进行了对Ne气的箍缩软X射线诊断工作。该喷气装置由4个充电至23 kV的电容器并联组成,总储能4.5 kJ,放电电流峰值210 kA,上升沿2.5μs。实验中通过观测放电电流微分信号来观测箍缩聚焦点的位置(波形的下凹尖峰点),此尖峰也是X光辐射的时间分辨点。利用响应时间为亚ns量级的光敏半导体探测器(PIN)探头获得了Ne气箍缩时等离子体发出的软X射线信号,X光辐射出现在放电电流微分信号突变点附近。一般来说,多次箍缩会导致多次的X光辐射输出,实验中的X光脉冲实际为多个等离子热点辐射叠加的结果,单次箍缩所产生的X光辐射比多次箍缩所产生的X光辐射要强。对每次箍缩来说,单个X光脉冲信号比多个X光脉冲信号的幅值要大。
X-ray radiation produced by a small gas puff Z-pinch device in Tsinghua University was detected. This device was powered by a 16 μF capacitor bank charged to 230 kV, corresponding to a storage energy of 4.3 kJ, the discharge current reached its peak value of 210 kA at a time of 2.5 μs. The X-ray radiation from a Neon gas puff Z-pinch was measured with a sub-ns rise time PIN detector. The differential signal of discharge current was recorded to determine the pinch point, when the X-ray radiation was emitted. The signals were analyzed and discussed in this paper.
出处
《强激光与粒子束》
EI
CAS
CSCD
北大核心
2006年第8期1405-1408,共4页
High Power Laser and Particle Beams
基金
国家自然科学基金资助课题(10035030)
