摘要
以聚酰胺酸作为基体,通过正硅酸乙酯(TEOS)和异丙醇铝的水解缩合反应后,与聚酰胺酸发生溶胶凝胶的过程,从而制备出不同比例的A l-Si氧化物纳米掺杂聚酰亚胺薄膜.利用原子力显微镜,傅立叶红外光谱和介电谱,对其表观形貌和介电性能进行了表征和测试,考察分析了了相应的结构与性能之间的关系.
In this paper, polyimide composite films with a varied proportion of Al - Si oxide were prepared, using polyamic acid as the matrix resin, by the sol-gel process of traethoxysilane （TEOS） and heteropropyl-aluminium. The surface morphology and chemical structure of the film were characterized by Atomic Force Microscope （AFM）, Fourier Transform Infrared Spectroscope （FTIR） and dielectric spectroscope. And the relations between the structures and the properties of the films were analyzed.
出处
《哈尔滨理工大学学报》
CAS
2006年第4期89-91,98,共4页
Journal of Harbin University of Science and Technology
基金
国家自然科学基金重点项目(50137010)
国家自然科学资助项目(50373008)
黑龙江省科技攻关项目(GC04A216)
