摘要
针对支路诊断法分析了电路的可测拓扑结构和可测拓扑条件,提出了可测性分析和可测性设计方法.在可测性设计过程中,通过适当地改变拓扑结构与可及节点的个数和位置,对电路中单故障和多故障的可测性予以判定.最后将该方法运用于非线性模拟电路的可测性问题分析.实验结果验证了该方法的有效性.
Testable topological structure and testable topological condition for branching diagnostic method are analyzed, testability analysis and testability design are presented. During testable design, the testability of single fault and multi-faults in circuit can be judged by changing topological structure, numbers and location of accessible nodes. The method is applied to testability analysis in nonlinear analog circuit, an illustration validated this method.
出处
《计算机辅助设计与图形学学报》
EI
CSCD
北大核心
2006年第10期1497-1501,共5页
Journal of Computer-Aided Design & Computer Graphics
基金
国家自然科学基金(60372001
90407007)
教育部博士点基金(20030614006)
关键词
非线性模拟电路
故障诊断
可测性设计
拓扑结构
nonlinear analog circuit
fault diagnosis
testability design
topological structure