摘要
本试验利用框架剖面法测定了大豆根系的生长动态和根系活性变化.结果表明:大豆根系生长过程呈S型曲线变化,形成慢生长(Ve-V_3),快速生长(V_3-R_5)和衰老(R_5),三个阶段,高峰值出现在 R_4一R_5阶段.根系活性变化与根系生长特点相似,R_1时期之前根系活性逐渐增强,R_2时期之后根系活性下降.
Root growths and root activities of soybcan [ Glycine max(L.) ]were investigated by usingthe framed monolith and pinboard method from 1992 to 1994. Root growth of soybean like thatof seed filling is referred to as sigmoid curve, and is divided into three stages:slow growing stage(Ve-V3), rapid growing stage (V3-R5) and senescence stage(after R5). Root activities of soybeanare similar to root growth.
出处
《大豆科学》
CAS
CSCD
北大核心
1996年第4期317-321,共5页
Soybean Science
关键词
大豆
根系
根系活性
Glycine max (L.)
Root growth
Root activity