摘要
介绍了电荷放大器在存储测试系统中的作用,详细说明了电荷放大器工作原理,推导出电荷量与输出电压之间的关系。通过故障树的方法对电荷放大器的可靠性进行分析,得出电荷放大器的MTBF和可靠性曲线,定量计算出电阻、电容、焊点和芯片在一个完整的存储测试电路中的失效率,定性的分析出不同部分对整体系统失效率的影响度。
This paper introduced the function and operating principle of charge amplifier in the stored testing and measuring system and then derived the relation of charge and output-voltage.The reliability of charge amplifier was analyzed by fault tree.The MTBF and reliability-curve of charge amplifier was obtained.The miss ratio to a whole stored testing and measuring system of resistance,capacltance,weld and CMOS chip was calculated.The influence of difference parts to the miss ratio of whole system was analyzed qualitatively.
出处
《中国测试技术》
2007年第1期86-87,共2页
CHINA MEASUREMENT & TESTING TECHNOLOGY
