摘要
介绍了电子产品快速瞬变脉冲群形成机理及相应的测试方法,综合其他研究者的成果及笔者的实践经验,针对快速瞬变脉冲群影响电子产品的不同特点提出了相应的对策方案,以方便电子产品设计人员及电磁兼容对策工程师在实际工作中参考、验证、改进和完善。
The mechanism of EFT/B generated in electronic products and the related measurement methods are discussed in the article. To different electronic products, EFT/B will produce different effects. Based on the other researchers＇ and the author＇s working experiences, some countermeasures to the effects of EFT/B are proposed to help the electronic product designers and EMC engineers to improve and optimize their work.
出处
《电子产品可靠性与环境试验》
2007年第1期5-10,共6页
Electronic Product Reliability and Environmental Testing
