摘要
本文用ＴＰＲ技术考察了Ｓｍ２－ｘＳｒｘＮｉＯ４的还原性能，探讨了Ｓｒ２＋取代对其结构及性能的影响．Ｓｍ２－ｘＳｒｘＮｉＯ４上有两个还原峰，低温还原峰的Ｔｍ值的变化趋势与Ｎｉ－ＯⅡ（／／ｃ－ａｘｉｓ）键长随ｘ的变化趋势相反，高温还原峰的Ｔｍ值的变化趋势与晶胞参数ｃ值的变化趋势相反．它们分别对应于不同结合态的氧的还原．
K2NiF4 type compounds Sm2-xSrxNiO4 were prepared by citric acid method. The reducibility of the compounds was studied by temperature-programmed reduction (TPR). There are two reduction peaks in the TPR profile for each sample. The peak temperature at lower temperature,Tmax,l, increases as x increase, which is just opposite to the changes of Ni-OⅡ
出处
《杭州大学学报（自然科学版）》
CSCD
1996年第4期351-354,共4页
Journal of Hangzhou University Natural Science Edition
基金
浙江省自然科学基金
