摘要
以龙芯1号处理器为研究对象,探讨了基于JTAG的处理器在片调试功能的验证方法.根据在片调试的结构特征建立了功能覆盖率模型,并以访存模式为基准分步建立虚拟验证原型.整个验证将定向功能测试和指令集随机测试有机地结合起来,迅速定位了设计中多个难以发现的错误.最终验证的功能覆盖率达到100%,FPGA原型经长时间运行无误.
With Godson-1 processor as the research prototype, a verification method of processor＇s on-chip-debugging function based on JTAG is presented in this paper. The functional coverage model was set up based on on-chip-debugging structure features and the virtual verification prototype was built steadily according to the different memory access modes. The whole verification integrated directed functional test and ISS random test into one flow, and located several ordinarily hard-to-discover bugs effectively. Finally, the functional coverage reached 100 %, and the FPGA prototype worked correctly for required long time.
出处
《计算机辅助设计与图形学学报》
EI
CSCD
北大核心
2007年第4期502-507,共6页
Journal of Computer-Aided Design & Computer Graphics
基金
国家自然科学基金杰出青年基金(60325205)
国家"八六三"高技术研究发展计(2002AA110010)
国家"九七三"重点基础研究发展规划项目(2005CB321600)
中国科学院计算技术研究所知识创新课题(20056230)
关键词
在片调试
覆盖率模型
虚拟验证原型
定向功能测试
随机测试
龙芯1号处理器
on-chip-debugging
verification coverage model
virtual verification prototype
directed functional test
random test
godson-1 processor
