期刊文献+

系统级封装(SIP)技术及其应用前景 被引量:9

Technology of System in Package and Its Applications Prospects
下载PDF
导出
摘要 随着各种半导体新工艺与新材料水平的不断提高,先进的封装技术正在迅速地发展。本文综述了先进的系统级封装(SIP)技术的概念及其进展情况;并举例说明了它的应用情况,同时指出,SIP是IC产业链中知识、技术和方法相互交融渗透及综合应用的结晶。SIP封装集成能最大程度上优化系统性能、避免重复封装、缩短开发周期、降低成本和提高集成度,掌握这项新技术是进入主流封装领域之关键,有其广阔的发展前景。 With higher standard of the new semiconductor processes and materials, the advanced package technology is developed rapidly. The concept and development of SIP (system in package) are described, its advantages are stated, its wide applications are illuminated. It is pointed out that SIP is the integrating result of knowledge, technique and process in IC industry. SIP can furthest optimize the system property, avoid the repeat of package, shorten the design period, cut the cost and raise integration. Mastering SIP is the key for entering the mainstream of package field, and the development prospects are great.
出处 《半导体技术》 CAS CSCD 北大核心 2007年第5期374-377,386,共5页 Semiconductor Technology
基金 江苏省高校科研成果产业推进工程计划项目(JHZD06-42)
关键词 系统级封装 片上系统 技术优势 应用前景 SIP SOC technologies superiority application prospects
  • 相关文献

参考文献9

二级参考文献35

  • 1翁寿松.超薄叠层芯片尺寸封装(UT-SCSP)[J].电子与封装,2005,5(1):11-12. 被引量:4
  • 2中国电子学会生产技术学分会从书编委会.微电子封装技术[M].合肥:中国科技大学出版社,2003..
  • 3JHON H L.BGA、 CSP、 DCA and flip-chip Technology[A]..Proceedings of the ISEP'' 96[C].,1996.20-27.
  • 4J-STD-012. Implementation of flip chip and chip scale technology[C], IPC, 1996.
  • 5JHON H L. BGA, CSP, DCA and flip-chip Technology[A]. Proceedings of the ISEP' 96[C].1996, 20-27.
  • 6CRUM S. Trends in advanced component technologies[J]. Electronic Packaging & Production, 1999, 38(1): 48-53.
  • 7GILG L. Known good die[J]. Journal of Electronic Testing: Theory and Applications, 1997 (8):15-25.
  • 8GHAFFARIAN R. Chip scale package implementation issues[J].Semiconductor, 2000,(10): 313-316.
  • 9GHAFFARIAN R. Chip scale package issues[J]. Microelectronics Reliability 2000,(40):1157-116.
  • 10AMAGAI M. Chip scale package (CSP) solder joint reliability and Modeling[J]. Microelectronics Reliability , 1999,(39): 463-477.

共引文献49

同被引文献68

引证文献9

二级引证文献22

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部