摘要
介绍了以西门子PLC(可编程控制器)用于薄膜测厚的全自动往复式X射线测厚仪的研制,介绍了该测厚仪的硬件构成和测厚的工作原理。该装置已成功应用在双向拉伸聚丙烯薄膜生产线上。
It described X-ray thickness gauge apparatus for plastic film including its working principle and hardware of its control system and the method of data processing, The equipment has been applied to BOPP product line successfully.
出处
《仪表技术与传感器》
CSCD
北大核心
2007年第5期18-19,共2页
Instrument Technique and Sensor
关键词
测厚仪
X射线
薄膜
thickness gauge
X - ray
plastic film
