摘要
本文报道了由高能物理所自行研制的全反射X射线荧光分析装置,在X射线荧光分析中,应用这个装置,将使入射X射线束产生的散射本底大大降低,从而显著地改善了X射线荧光分析的检测限与灵敏度。在初始束路程上,由于能量切割反射体的应用,使初始谱的低能部分本底也明显下降。文中还给出了全反射条件下六种元素的检测限。
The experimental set-up of a total reflection X-ray fluorescence spectrometer was developed by us in Institute of High Energy Pnysics. The background caused by scattering of primary photons from both the substrate and the sample was essentially reduced using total reflection equipment, that improves the lower detection limits in the X-ray fluoresence analysis and consequently the sensitivity as well. The spectral distribution of the primary radiation was measured with the cut-off reflector in the path of the primary beam, its consequence for reducing of the background at the low energy part of the spectrum was clearly demonstrated. The detection limits for 6 elements were given below a few nanograms.
出处
《光谱学与光谱分析》
SCIE
EI
CAS
CSCD
北大核心
1990年第6期64-67,58,共5页
Spectroscopy and Spectral Analysis
