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可逆电路中门失效错误的定位方法

Fault Location for Missing-gate Fault in Reversible Circuits
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摘要 可逆电路是量子计算科学、低能耗COMS以及纳米技术蜒究的基础。确保可逆电路的正确性和可靠性,错误检测和定位必不可少。本文通过分析可逆电路发生门失效错误时对电路的影响,给出了一种门失效模型的错误定位方法,即生成错误定位树的方法。本文生成的错误定位树中,根据输入向量的不同输出能把当前错误集划分成多个小的错误集,使得树的高度较小,定位错误较快。此外,在生成电路的错误定位树时不需要生成真值表和错误表,从而节省了大量的存储空间,所以能应用于大型的电路。 Reversible circuit is the base of quantum computation,low-power CMOS,and nanotechnology.To ensure the validity and reliability of the reversible circuits,fault detection and localization is necessary.By analyzing the influence of MGF on the reversible circuit′s output,this paper introduces a method to locate missing-gate fault(MGF),that is building fault localization tree.The method introduced in this paper can divide the current fault set into several subsets,the height of the fault location tree(FLT) is short and the time need to locate the fault is small.In addition,it doesn′t need truth table and fault table,so it can be applied to large circuits.
出处 《光电子技术》 CAS 2007年第3期152-160,165,共10页 Optoelectronic Technology
基金 国家自然科学基金资助项目(60572071) 国家自然科学基金会重大研究计划资助项目(90412014) 江苏省自然科学基金项目(BK2005053 BM2006504 BK2007104) 江苏省高校自然科学基金项目(06KJ520137)
关键词 可逆电路 错误模型 门失效模型 错误定位 错误定位树 reversible circuit fault model missing-gates fault fault location fault location tree
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参考文献10

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