摘要
静电衰减时间常数是定量描述材料静电性能的重要物理量,可以通过测量静电电荷衰减时间达到测量静电的目的。在对现有静电测试方法以及各类静电衰减测试仪研究的基础上,基于单片机原理设计出多功能电荷衰减测试仪,它集充电法、电晕喷电法、摩擦法测试功能为一体,弥补了现有静电衰减测试仪功能单一的不足,利用单片机本身的定时计数功能得到精确的静电电荷衰减时间。
The constant of electrostatic charge decay time is a important physical quantity that can describe the dectmstatics property of materials. With analysis of present electrostatic test methods and different electrostatic ehurge decay test devices, designing a multifunction electrostatic ehurge decay test device based on the theorem of single chip computer. It includes charging test method, corona charging decay test method and tribeeleetrie test method, makes up for the unity and shortcomings of present electrostatic charge decay test apparatus, utilizes the capability of counting time of single chip compute to measure precise electrostatic charge decay time.
出处
《仪表技术与传感器》
CSCD
北大核心
2007年第11期11-12,71,共3页
Instrument Technique and Sensor
关键词
单片机
衰减时间
计时
测试方式
仪器
single chip computer
decay time
counting time
test method
apparatus
