摘要
A kind of low power connector used e.g. in household appliances was partly burned in routine experiment. The heat sources were four paralleled contacts constructed by springs (Sn/CuSn-alloy) in socket and a plug sheet (Ni/Steel) while mating. The contact interfaces were detected by scanning electronic microscope (SEM) and X-ray energy dispersive spectros- copy (XEDS), obvious wear tracks and various contaminants, including element Si, Al, Na, K, S, Cl, O, etc., were found. The contamination degrees on the four paralleled contacts were different, so that the ratio of average contact resistance on the four contacts was about 5:8:3:1. The maximum contact resistance on contacts of the plug sheet reached 28 ?. The main failure rea- sons were fretting and contamination between the contact interfaces. Fretting simulation showed that connection resistance of connectors was raised up, even to ohms level. When the current increased to 5 A, the socket housing was heated and decom- posed. By the thermal analysis, it was estimated that the connector would be burned under the lower current if the current was not evenly distributed on the four paralleled contacts caused by uneven contamination. Improvement methods for connector failure are also discussed.
A kind of low power connector used e.g. in household appliances was partly burned in routine experiment. The heat sources were four paralleled contacts constructed by springs （Sn/CuSn-alloy） in socket and a plug sheet （Ni/Steel） while mating. The contact interfaces were detected by scanning electronic microscope （SEM） and X-ray energy dispersive spectroscopy （XEDS）, obvious wear tracks and various contaminants, including element Si, Al, Na, K, S, Cl, O, etc., were found. The contamination degrees on the four paralleled contacts were different, so that the ratio of average contact resistance on the four contacts was about 5：8：3：1. The maximum contact resistance on contacts of the plug sheet reached 28Ω. The main failure reasons were fretting and contamination between the contact interfaces. Fretting simulation showed that connection resistance of connectors was raised up, even to ohms level. When the current increased to 5 A, the socket housing was heated and decomposed. By the thermal analysis, it was estimated that the connector would be burned under the lower current if the current was not evenly distributed on the four paralleled contacts caused by uneven contamination. Improvement methods for connector failure are also discussed.
