摘要
ＦＴ－ＩＲ吸收谱用来研究具有多孔结构的ＴｉＯ２／ＳｉＯ２复合薄膜；薄膜在１２００ｃｍ－１有一较强的肩峰，其强度与峰位随热处理温度而产生变化。在９５５ｃｍ－１的吸收峰是由于Ｓｉ－Ｏ－Ｔｉ和Ｓｉ－ＯＨ的结果，并随着热处理温度的提高其吸收峰完全是Ｓｉ－Ｏ－Ｔｉ振动所引起的，其峰位随着ＴｉＯ２含量的增加，向低频区域移动。ＴｉＯ２锐钛矿结构的析出是从非晶富Ｔｉ的氧化物区域分凝出来的，并不减少Ｓｉ－Ｏ－Ｔｉ振动强度。
Fourier transform infrared absorption spectroscopy had been utilized to study the structure of porous silica titania thin film. At 1200cm 1 , the film had broad bands arose from asymmetric stretching vibration of Si O Ti bridging sequences. As the temperature increased, these bands were shifted to higher frequencies and broadened to high frequency side. This changes were attributed to densification of the film. The band at 955cm 1 was attributed to Si O Ti and Si OH vibrational mode. As the TiO 2 content was increased, this band shifted to lower frequencies. amorphous TiO 2 rich regions were formed in the network. These Amorphous TiO 2 rich regions were to crystallize during continue thermal treatment.
出处
《功能材料》
EI
CAS
CSCD
北大核心
1997年第5期490-491,共2页
Journal of Functional Materials
