摘要
基于具有偏振相关损耗和双折射的密勒矩阵洛伦兹变化特性,提出了一种测量偏振相关损耗的新方法.证实了测量偏振相关损耗取决于密勒矩阵的第一列元素.提出了一种实用的测量方法.新方法对于偏振相关损耗的测量只需要两个输入偏振态,因此具有测量速度快和测量误差小的优点,实验的测量结果证实了该方法的可靠性.
Based on the Lorentz property of Mueller matrix of optical devices with both PDL and birefringence,a new PDL measurement method is proposed. It is proved that PDL depends on the first column of the Mueller matrix. A practical method is proposed for measurement of PDL. The new method employs only two input SOPs. So it has the advantage of higher measurement speed and lower measurement error. The experiment shows the reliability of the new method.
出处
《光子学报》
EI
CAS
CSCD
北大核心
2007年第12期2281-2283,共3页
Acta Photonica Sinica
关键词
偏振度
偏振态
偏振相关损耗
Degree of Polarization（DOP）
State of Polarization（SOP）
Polarization Dependent Loss（PDL）
