摘要
本文利用电化学腐蚀方法设计并搭建了一种扫描隧道显微镜(STM)针尖制备的直流腐蚀电路。电路中使用了9013三极管和LM311快速比较器,使电解池切断时间低于500ns,成功地制备了质量较高的钨针尖。
A set of electrocircuts were designed and established for DC electrochemical etching procedure to prepare STM tips. Triodes (9013) and high-speed comparators (LM311) were used in the etching circuits resulting in out-off time being less than 500ns and high quality STM tips being prepared.
出处
《苏州大学学报（自然科学版）》
CAS
1997年第3期47-50,共4页
Journal of Soochow University(Natural Science Edition)
关键词
扫描隧道显微镜
电化学腐蚀
钨针尖
针尖
Scanning Tunneling Microscope (STM ),Elcctrocllcmical Etching, W tips.
