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AlGaN/GaN场板结构高电子迁移率晶体管的场板尺寸优化分析 被引量:2

Geometrical optimization of AlGaN/GaN field-plate high electron mobility transistor
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摘要 对不同场板尺寸的AlGaN/GaN场板结构高电子迁移率晶体管进行了研究,建立简化模型分析场板长度对沟道电场分布的影响.结果表明,调整钝化层厚度和场板长度都可以调制沟道电场的分布形状,当场板长度较小时,随着长度的增大器件击穿电压随之增加,而当长度增大到一定程度后器件击穿电压不再增加.通过优化场板长度,器件击穿电压提高了64%,且实验结果与模拟结果相符. Results of investigation on AlGaN/GaN field-plate high electron mobility transistor with different field-plate (FP) geometry are presented. The effect of the field-plate length Lfp on the electric field distribution in the channel is thoroughly analyzed by establishing a simplified model. The simulation gives the following estimates: Both the FP length LFP and the thickness t of the insulator under the FP, can reshape the electric field distribution in the channel. If LFP is short, the breakdown voltage Vbr increases with LFP. When LFp increases to a certain extent, Vbr keeps invariable. After optimizing LFP in this paper, Vbr has been increased by 64% . Good agreement between experimental and simulation data is achieved.
出处 《物理学报》 SCIE EI CAS CSCD 北大核心 2008年第4期2456-2461,共6页 Acta Physica Sinica
基金 国家重点基础研究发展规划(批准号:2002CB311904) 国家自然科学基金(批准号:60676048,F040402)资助的课题~~
关键词 ALGAN/GAN 击穿电压 场板长度 AlGaN/GaN, breakdown voltage, field-plate length
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参考文献6

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二级参考文献12

  • 1郝跃,韩新伟,张进城,张金凤.AlGaN/GaN HEMT器件直流扫描电流崩塌机理及其物理模型[J].物理学报,2006,55(7):3622-3628. 被引量:6
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