摘要
可靠性分析对提高系统的可靠性有着极其重要的意义。针对存储测试系统存在的失效现象,从半导体器件本身、焊接工艺和封装工艺进行了失效机理分析,提出了相应的改进措施。在此基础上,结合本系统的实际使用要求,提出了半导体器件的可靠性筛选规程。阐述内容对其他电路系统可靠性的提高也具有一定的参考价值。
Reliability analysis plays an important role in the improvement of the reliability of system. The failure mechanism of the memory test system is analyzed through the semi-conducting devices and technical process of soldering and packaging and the appropriate improvement measures are proposed in the paper. The reliability screening methods of semiconductor devices based on the practical requirement are presented. The reliability analysis method provided in this paper is available for reference
出处
《火力与指挥控制》
CSCD
北大核心
2008年第4期146-148,共3页
Fire Control & Command Control
关键词
存储测试
失效机理
可靠性分析
memory test, failure mechanism, reliability analysis
