摘要
本文以编号为SPN氨化硅与编号为M(20)、M(50)的Sialon材料为例在无压烧结、气压烧结和热等静压烧结等工艺条件下进行烧结，测试了材料性能，用SEM、EM和X折射等分析手段观察材料的显微结构和相组成，及其对材料性能的影响进行了讨论。
Different sintering processes such as PLS, GPS and presintering + HIP are used to fabricate silicon nitride(SPN) and Sialon materials (M,,, M,), then the mechanical properties of the ceramic materials are measured. Themicrostructure and phase compo8ition 0f the sampled are analysised by means of SEM, EM and X-ray diffraction. Al-so the effects of these sintering technologies on properties of the ceramics are discussed in the paper.
出处
《陶瓷学报》
CAS
1997年第2期96-101,共6页
Journal of Ceramics
基金
"95"863计划资助
关键词
氮化硅陶瓷
烧结
显微结构
陶瓷
sintering technology, silicon nitride (SN), microstructure
