摘要
采用试样粉末直接压片,基体效应用仪器软件方法校正,谱线重叠干扰以本文提出的"干扰增量法"测量与计算出重叠校正系数K,输入仪器自动校正。用X射线荧光光谱法测定了钒渣中V2O5,SiO2,A l2O3,CaO,MgO,MnO,TiO2,Cr2O3,S,P含量。该方法测定钒渣标样的结果与认可值符合良好,试样9次压片测定各成分的相对标准偏差在0.09%—0.64%范围内。
Using pressed powder slice, matrix effect is calibrated by the software of instrument. The interference of spectra overlap is corrected with ＂interference incremental method＂. The method has been applied to the determination for V2O5, SiO2, Al2O3, CaO, MgO, MnO, TiO2, Cr2O3, S, P in standard vanadium slag samples, the results consistent with certified values. The relative standard deviation was O. 09%--0.64% （n=9）.
出处
《光谱实验室》
CAS
CSCD
2008年第3期416-420,共5页
Chinese Journal of Spectroscopy Laboratory
关键词
粉末压片
X射线荧光光谱
钒渣
干扰增量法
谱线重叠校正
Powder Pressed Slice
X-Ray Fluorescence Spectrometry
Vanadium Slag
Interference Incremental Method
Spectra Overlap Correction
