摘要
在大规模平面光路器件的布版中不可避免地会发生光波导交叉情况,交叉波导引入的损耗和串扰随交叉角度的变化而变化。文章围绕这个问题制作了硅基二氧化硅交叉波导样品并进行了损耗及串扰测试,结果表明,采用大于25°的交叉角度,可使每个交叉点的损耗小于0.1 dB,串扰小于-40 dB,满足器件的设计要求。
Crossings of waveguides are inescapable in layout of lager scale planar lightwave circuit devices. Loss and crosstalk by cross-waveguides are influenced by the crossing angle. In this paper, presented are the results of a series of experiments for the silica-based intersection waveguide. The results show that using more than 25° angle of the intersection of crosswaveguide can meet the devices design requirements with loss less than 0.1 dB and crosstalk less than -40 dB at every crossing.
出处
《半导体光电》
EI
CAS
CSCD
北大核心
2008年第4期475-477,共3页
Semiconductor Optoelectronics
基金
华中科技大学博士后科研专项基金资助项目
关键词
集成光学
平面光路
交叉波导
损耗
串扰
integrated optics cross-waveguide insert loss
crosstalk
